Hybrid Test Method Lowers Cost, Improves Quality
Vectorless test coverage has been increased through the company’s VTEP v2.0 upgrade with Cover-Extend Technology. By combining boundary scan and VTEP vectorless testing, you can overcome loss of access caused by smaller form factors, BGA packaging, significantly more memory, and high-speed bus lines. A connector driven by a boundary scan-capable IC can now be tested by a VTEP sensor. Cover-Extend Technology benefits from automatic test generation, test debug, and fault grading.
In addition, because the VTEP sensor does not exert pressure on the PCB, the strain caused by multiple pogo-pin test fixtures is avoided. The result is improved quality in spite of limited test access.
Agilent Technologies