Keithley Releases New 2008 Test and Measurement Product Guide
Cleveland, OH, January 30, 2008
Keithley Instruments, Inc. (NYSE:KEI) has released its 2008 Test and Measurement Product Guide. This handy product guide offers details and specifications on the company’s general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test hardware. Tutorials simplify choosing solutions for specific applications.
Arranged by product type and application area, each section of the guide contains technical information on test-system design and use with practical tips to help users avoid common measurement errors, increase productivity, and lower cost of test. It includes tutorials and selector guides as well as information on the newest innovations in test and measurement:
- Digital Multimeters and Systems
- Switching and Control
- RF/Microwave Sourcing, Switching, and Measurement
- Specialized Power Supplies
- Source and Measure Products
- Low-Level Measurement and Sourcing including Low-Current, High-Resistance Measurements and Low-Voltage, Low-Resistance Measurements
- Pulse/Pattern Generators
- Semiconductor Test
- Optoelectronics Test
- Series KPXI System Products
- Data Acquisition Products
Several new products are featured in the guide:
- The 4x4 MIMO (multiple-input, multiple-output) RF test system for R&D and production testing of next-generation RF communications equipment and devices consisting of the Model 2920 Vector Signal Generator and the Model 2820 Vector Signal Analyzer, the Model 2895 MIMO Synchronization Unit, and MIMO Signal Analysis Software.
- The Models 2635 and 2636, additions to the Series 2600 System SourceMeter® Multi-Channel I-V Test Solutions, with low-level measurement capabilities.
- The Series 3700 System Switch/Multimeter and Plug-In Card Family, the next-generation platform of switching and integrated DMM test solutions.
- The Model 2100 6½-Digit USB DMM, a high precision, low-cost USB-based instrument.
- ACS (Automated Characterization Suite) integrated test systems for semiconductor characterization at the device, wafer, and cassette level.
- Hardware and software advances for the Model 4200-SCS Semiconductor Characterization System, including an enhanced pulse generator card, a new scope card and a new C-V measurement capability.
To request a free copy of Keithley's 2008 Test and Measurement Product Guide, call 1-888-KEITHLEY or visit www.keithley.com/pr/080.
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