Semiconductor Consortium Meeting
February 7, 2008
The next STC meeting will be held March 13 in Austin, TX, and focus on three Semiconductor Test Interface eXtensions (STIX) Working Groups (WG). The majority of the time will be spent in separate WG breakout meetings working toward developing open specifications. The breakout WGs are the following:
- Portable Test Instrument Module (PTIM) - Standardization of a module interface, which could be used in different ATE architectures.
- Yield Enhancement Analysis Tools - Standardize on some handshake for how to interact with equipment. This would be linked to a consistent API.
- Probe Card - Promote standardization to enable test cost reductions, increase yield, and shorten probe card design and manufacturing time.
Hotel Reservations
Make your reservations early. Austin is very busy this week, and most of the hotels are holding rooms or booking them very fast.
Courtyard Austin Airport
7809 E. Ben White Blvd.
Austin, TX 78741
Phone: 512-386-7464
A block of rooms at a discounted rate of $179/night for this event will be held until Feb. 27th or whenever the room block is full. Please mention STC when calling to reserve rooms.
Meeting Registration
Register by e-mailing Barb Estes at
STCadmin@semitest.org on or before Friday February 29. If the demand is high, the number of attendees for this meeting may be limited based on the capacity of meeting rooms.
Agenda:
- 8:30 am Continental Breakfast
- 9:00 am STIX Initiative WGs Framework
- 9:15 am Separate PTIM, Yield Enhancement Analysis Tools, and Probe Card WG
Breakouts
- 12:00 pm Lunch
- 1:00 pm Separate PTIM, Yield Enhancement Analysis Tools, and Probe Card WG
Breakouts Continued
- 3:30 pm Break
- 3:45 pm WG Progress Reports
- 4:45 pm Updates from DIWG, University, Solutions, and Marketing WGs
- 5:15 pm Closing Remarks
- 5:25 pm Adjourn
Direct questions to Bob Helsel, STC Manager, 303-652-1311 STC Office,
bhelsel@semitest.org