Semiconductor Wafer Test Workshop
Paradise Point Resort, San Diego, CA, June 8-11,
2008
The 18th annual IEEE Semiconductor Wafer (SW) Test Workshop will be held June 8-11 at the Paradise Point Resort in San Diego. It will begin on Sunday afternoon with a topical tutorial, followed by a welcome reception, dinner, and a keynote speaker. The technical program will start Monday morning with 30-minute presentations in theme-oriented sessions.
SW Test EXPO 2008 will showcase many of the key suppliers to the wafer probe industry and, there will be ample opportunities for networking. The workshop will conclude on Wednesday with an awards presentation and luncheon.
Topics for the podium presentations and poster sessions for 2008 will include the following:
- New probe card and contactor technologies.
- Challenges of 300-mm wafer probing.
- Monitor and reduction of chip I/O pad damage.
- Area array and C4 solder bump probing.
- Parallel, multisite probing.
- Probe card PCB characterization.
- Productivity improvements for high-volume production.
- Probe data collection, analysis, and management.
- Probe card cleaning, extending card life, and improving cost of ownership.
- Advances in probe card analyzers and metrology tools.
- Addressing probing requirements: copper I/O pads; RF and microwave; mixed-signal, low noise, and parametric; low-k dielectric and probe over active circuitry; probing for known-good die; high power devices; and probe potpourri (anything goes).
Conference registration includes all meals, refreshments, social activities, technical program and exhibit attendance, and the printed proceedings distributed at the workshop. Details regarding SW Test 2008 and all previous electronic versions of past proceedings can be found at
http://www.swtest.org./
The SW Test Workshop is sponsored by the IEEE Components, Packaging, and Manufacturing Technology Society. It is the only IEEE-sponsored event that focuses on all aspects associated with microelectronic wafer- and die-level testing. Featuring both manufacturer and vendor presentations, this is not a sales show nor an academic or theoretical conference but rather a probe technology forum where attendees learn about recent developments in the industry and exchange ideas in a relaxed atmosphere with time for informal discussion and networking.
More than 460 technologists attended the 2007 SW Test Workshop. It featured a
technical program of 33 in-depth podium and 12 poster presentations, 40 supplier exhibits, embedded tutorials for those new to the wafer probe business, and informal networking. Of the presentations, 45% were made by suppliers, 30% by semiconductor manufacturers, and 25% were collaborative efforts from both.