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    Welcome to Electronic Design's destination for test and measurement technology trends, products, industry news, new applications, articles and commentary from our contributing technical experts and the community.
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    Power

    Dynamically Testing WBG Power Semiconductors Down to the Die

    Upgrades to Keysight’s double-pulse test systems bring easier and even higher-accuracy measurement of dynamic characteristics of bare wide-bandgap power semiconductor dies.
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    Automation

    Designing to Support Energy-Efficient Edge AI in Process Applications

    AI is moving to the edge, and that’s a good thing. But designers must prepare for voracious power demands and be ready with the right hardware and the right strategies to optimize...
    iToF Sensor Offers Precision Distance Measurements and 3D Imaging
    Industrial

    iToF Sensor Delivers Precision Distance Plus 3D Imaging

    onsemi’s Hyperlux ID family of indirect time-of-flight (iToF) sensors offer high precision at a long distance in addition to 3D imaging of fast-moving objects.
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    Cellular

    6 Steps for Streamlining 5G O-RAN Radio Testing @ mwrf.com

    The O-RAN open-source model helps network designers avoid supplier lock-in, accelerating 5G deployment, reducing operational costs, and simplifying maintenance. But overcoming...
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    Analog

    Trio of Tiny Supervisory ICs Offers Tiered Features and Functions

    Small, limited-function ICs, such as watchdog timers, can make the difference between fairly good performance and solid system behavior.

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    Dreamstime

    Special Report: Testing the Limits of Test and Measurement

    Test and measurement is becoming an even more important facet of modern electronic design.
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    Automotive

    Advancing BMS Testing with Accurate Emulation for EVs

    Precise emulation is transforming BMS testing by eliminating the inefficiencies of traditional methods, enabling engineers to simulate charge and discharge cycles rapidly and ...
    erchog_dreamstime_208492500 (and Yokogawa)
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    Power

    High-Voltage, Wide-Bandwidth Probe Tests the Limits of Power Electronics

    Yokogawa said its latest high-voltage, wide-bandwidth probe can stay on top of the faster switching speeds of next-generation power electronics like SiC.
    How To Extract the Best Performance for On-Wafer RF Devices
    Test & Measurement

    How To Extract the Best Performance for On-Wafer RF Devices

    A combination of many tools from a variety of sources is needed to test and verify on-wafer RF devices.
    Boston University
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    Test & Measurement

    Electro-optics Plus Algorithms Yield Continuous Blood-Pressure Readings

    Sophisticated instrumentation, advanced algorithms, and machine learning enable real-time, on-the-go blood-pressure and other blood-flow measurements.