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Rick's Blog

How can you compete against robots? Thomas H. Davenport and Julia Kirby, writing in the June issue of the Harvard Business Review, have some ideas. Before listing them, they outline what they call the three eras of automation. First, in the 19th century, machines began taking on dirty and dangerous jobs. In the 20th century, automation took over dull, routine service jobs and clerical chores. Now, in the third era, machines are taking on what I’ll call the fun jobs—they are making decisions, and they can often make better...
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Billons of Internet of Things devices are presenting significant test-and-measurement challenges. Instrumentation makers are expanding their portfolios to meet the multi-standard testing requirements of...

At the 2015 IEEE International Symposium on Electromagnetic Compatibility and Signal Integrity held last month in Santa Clara, I attended two technical presentations related...

If you manufacture or import laboratory and test-and-measurement equipment, pressure and flow transducers, analyzers, or process-control equipment for distribution in the European Union, make...

A move to a culture of affordability is a key trend in the military/aerospace test arena, according to Andrew Smail, product and solutions marketing...

A few weeks ago, Frost & Sullivan hosted a virtual panel on 5G, featuring speakers from Alcatel-Lucent, NYU Wireless, and National Instruments. Here are...

Innovations in high-speed digital test have taken center stage early this year, at least in part thanks to the stage provided by DesignCon held...

Special Reports

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How does your scope answer this question: What’s wrong with this signal? Typically, that’s the question users want to ask, but it’s not always...

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Wireless and landline telecommunications companies and service providers face significant challenges in rolling out, maintaining, and upgrading their networks and infrastructure to support multiple...

MAGAZINE - JUNE EDITION

In 2015, there’s not much question about audio storage, transmission, or streaming: it’s digital. Apart from rare sightings of vinyl or open-reel tape in...

OFC marked its 40th anniversary when it convened recently in Los Angeles. The event, which show organizers describe as “the largest global conference and...

Bryan Sayler, a 27-year veteran of the EMC industry, is vice president for solutions development at ETS-Lindgren, with duties that include identifying marketing trends...

April marked the 50th anniversary of Moore’s Law and the arrival of the Apple Watch. Clearly, the advances in semiconductor technology forecast by Gordon...

Switching System Test Tools The eBIRST diagnostic test tools, designed specifically for the vendor’s PXI, PCI, or LXI (Ethernet) products, simplify switching system fault finding...

How does your scope answer this question: What’s wrong with this signal? Typically, that’s the question users want to ask, but it’s not always...

Wireless and landline telecommunications companies and service providers face significant challenges in rolling out, maintaining, and upgrading their networks and infrastructure to support multiple...

In the process of debugging and validating both digital and RF designs, the oscilloscope Fast Fourier Transform (FFT) function and a variety of other...

Sensors Expo & Conference will celebrate 30 years of focusing exclusively on sensors and sensor-integrated systems when it convenes June 9-11 in Long Beach,...

Prevention is better than cure, and the fourth edition of IEC 60601-1-2 certainly takes that to heart. The updated standard introduces many technical changes...

WHITE PAPER

Many multifunction devices require wider bandwidths, complex modulation schemes and multiple transmit and receive chains, which significantly increases device...


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